Ellipsometric study of the electronic behaviors of titanium-vanadium dioxide (TixV1−xO2) films for 0 ≤ x ≤ 1 during semiconductive-to-metallic phase transition

Applied Physics Letters, Volume 118, Issue 8, February 2021. Titanium-vanadium dioxide or TixV1−xO2 films for 0 ≤ x ≤ 1 were examined using ellipsometry, and their optical constants (n and k) at visible and near-infrared wavelengths were determined at …

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